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Magazine Name : Ieee Design And Test Of Computers
Year : 2000Volume number : 17Issue:04
Functionally Testable Path Delay Faults On A Microprocessors.(Article) Subject:
Author:
Angela
Krstic
Kwang-Ting
(Tim) Cheng
Wei-Cheng
Lai
page:
06
-
14
Power-/Energy-Eficient Bist Schemes For Processor Data Paths.(Article) Subject:
Author:
Mihalis
Psarakis
Dimitris
Gizopoulso
Nektarios
Kranitis
page:
15
-
28
Test Development For A Third-Version Coldfire Microprocessor.(Article) Subject:
Author:
Tersea L
Mclaurin
Michael
Mateja
Alfred. L
Crouch
page:
29
-
37
Effectiveness Of Microarchitecture Test. Program Generation.(Article) Subject:
Author:
John Paul Shen
Shen
R. D
Shawn
Noppanunt
Utamaphethai
page:
38
-
50
Collection And Analysis Of Microprocessor Design Errors.(Article) Subject:
Author:
John P
Hayes
Trevor
Mudge
David Van
Campenhout
page:
51
-
60
Validating Powerpc Microprocessor Custom Memories.(Article) Subject:
Author:
Magdy S
Abadir
Andrew K
Martin
Narayanan
Krishnamurthy
page:
61
-
76
Postssilicon Validation Methodology For Microprocessor.(Article) Subject:
Author:
Hemant
Rotithor
page:
77
-
89
Efficient Multiplexer Synthesis Technique.(Article) Subject:
Author:
Subhasish
Mitra
Lanae J
Avra
Edward J
Mccluskey
page:
90
-
97